The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2021

Filed:

Oct. 16, 2019
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Xiongcheng Li, Beijing, CN;

Xinlei Xu, Beijing, CN;

Geng Han, Beijing, CN;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
G06F 3/064 (2013.01); G06F 3/0616 (2013.01); G06F 3/0619 (2013.01); G06F 3/0631 (2013.01); G06F 3/0653 (2013.01); G06F 3/0689 (2013.01); G06F 11/1092 (2013.01);
Abstract

Techniques manage a redundant array of independent disks. Such techniques involve: obtaining information on a wear level associated with each of a plurality of disks; selecting, based on the information on the wear level, a group of disks from the plurality of disks, a difference between the wear levels of any two of the group of disks being below a predetermined threshold; and creating a RAID with extents from the selected group of disks. Such techniques can sufficiently utilize the wear level to balance the data storage distribution among redundant arrays of independent disks, thereby enabling efficient management of redundant arrays of independent disks.


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