The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 2021
Filed:
Mar. 29, 2021
Renesas Electronics Corporation, Tokyo, JP;
Christopher Semanson, Durham, NC (US);
Onkar Raut, Sunnyvale, CA (US);
James Page, Hillsborough, NC (US);
RENESAS ELECTRONICS CORPORATION, Tokyo, JP;
Abstract
Systems and methods for determining a likelihood of an occurrence of an anomaly in a sensor are described. A processor can receive a first measurement of a first capacitance change between a first port and a second port of a device connected to the sensor. The first measurement can be obtained in response to the first port being configured to perform a first function, and in response to the second port being configured to perform a second function. The processor can receive a second measurement of a second capacitance change between the first and second ports. The second measurement can be obtained in response to the first port being configured to perform the second function, and in response to the second port being configured to perform the first function. The processor can determine the likelihood of the occurrence of the anomaly based on the first and second measurements.