The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 2021
Filed:
Mar. 30, 2016
Applicant:
Renishaw Plc, Wotton-under-Edge, GB;
Inventors:
Derek Marshall, Hawkesbury Upton, GB;
John Charles Ould, Backwell, GB;
Assignee:
RENISHAW PLC, Wotton-under-Edge, GB;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/401 (2006.01); G01B 21/04 (2006.01); G05B 19/408 (2006.01);
U.S. Cl.
CPC ...
G05B 19/401 (2013.01); G01B 21/042 (2013.01); G01B 21/047 (2013.01); G05B 19/4083 (2013.01);
Abstract
A method is described for analysing probe data collected by a scanning probe carried by a machine tool. The probe data is collected as the machine tool moves or scans the scanning probe along a scan path relative to a workpiece. The method includes a step of identifying a property of the scan path used by the machine tool from a characteristic of the collected probe data. In this manner, the scan path can be identified from the probe data alone without having to receive any position data from the machine tool.