The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2021

Filed:

Feb. 26, 2019
Applicant:

Olympus Corporation, Tokyo, JP;

Inventor:

Tadashi Hirata, Tokyo, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 21/02 (2006.01); G02B 21/00 (2006.01); G02B 21/26 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/06 (2013.01); G02B 21/00 (2013.01); G02B 21/02 (2013.01); G02B 21/26 (2013.01); G02B 21/36 (2013.01);
Abstract

An observation apparatus is provided with: an illumination optical system that emits illumination light upward from below a specimen; and an image-capture optical system that captures, below the specimen, transmitted light which is the illumination light that has been reflected above the specimen and passed through the specimen, wherein the illumination optical system is provided with a diffusion plate, the image-capture optical system is provided with an objective optical system, and, in the case in which an emission region in the illumination optical system is projected to a pupil of the image-capture optical system, predetermined conditions are satisfied so as to partially block the illumination light at an edge portion of the pupil of the objective optical system.


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