The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 2021
Filed:
Jun. 06, 2017
Applicant:
Microvision, Inc., Redmond, WA (US);
Inventors:
Bin Xue, Mukilteo, WA (US);
P. Selvan Viswanathan, Bellevue, WA (US);
Robert James Jackson, Monroe, WA (US);
George Thomas Valliath, Winnetka, IL (US);
Assignee:
Microvision, Inc., Redmond, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01); G01S 7/4865 (2020.01); G01S 7/481 (2006.01); G01S 7/48 (2006.01); G01S 17/10 (2020.01); G01S 17/42 (2006.01); G01S 17/00 (2020.01);
U.S. Cl.
CPC ...
G01S 7/4865 (2013.01); G01S 7/4808 (2013.01); G01S 7/4817 (2013.01); G01S 17/003 (2013.01); G01S 17/10 (2013.01); G01S 17/42 (2013.01); G06K 2209/401 (2013.01);
Abstract
A scanning display system includes two detectors for rangefinding. Round trip times-of-flight are measured for reflections of laser pulses received at the detectors. A proportional correction factor is determined based at least in part on the geometry of the scanning display system. The proportional correction factor is applied to the measured times-of-flight to create estimates of more accurate times-of-flight.