The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2021

Filed:

Sep. 18, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Josephine B. Chang, Bedford Hills, NY (US);

Hendrik F. Hamann, Yorktown Heights, NY (US);

Siyuan Lu, Yorktown Heights, NY (US);

Ramachandran Muralidhar, Mahopac, NY (US);

Theodore G. Van Kessel, Millbrook, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/00 (2006.01); G01N 33/18 (2006.01); G01P 5/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/0062 (2013.01); G01N 33/007 (2013.01); G01N 33/0031 (2013.01); G01N 33/0036 (2013.01); G01N 33/0075 (2013.01); G01N 33/18 (2013.01); G01P 5/00 (2013.01);
Abstract

A method for measuring pollution that includes providing a plurality of analyte sensors arranged in a grid over a sensing area, wherein the analyte sensors measure a pollutant, and positioning at least one current sensor in the sensing area. A pollution source is localized using a pollution source locator including a dispersion model and at least one hardware processor to interpolate a location of a pollution source from variations in current measured from the current sensors and measurements of pollutants from the analyte sensors.


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