The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2021

Filed:

Sep. 16, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

William James Anderl, Rochester, MN (US);

Sarah K. Czaplewski-Campbell, Rochester, MN (US);

Jason T. Wertz, Pleasant Valley, NY (US);

Brandon M. Kobilka, Fishkill, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 19/08 (2006.01);
U.S. Cl.
CPC ...
G01N 19/08 (2013.01);
Abstract

A method and a system for non-destructively detecting defects within and/or on plated-through holes are provided. The method includes sealing a plated-through hole on a printed circuit board to detect for possible defects along the sidewall of the plated-through hole. The method further includes applying an airflow through the plated-through hole and measuring the airflow entering the plated-through hole at the gasket to determine the initial airflow calculation. The method also includes measuring the airflow again as it exits the plated-through hole to determine an exit airflow calculation. A determination of the quality of the plated-through hole is made by the method by analyzing the initial airflow calculation and the exit airflow calculation.


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