The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2021

Filed:

Nov. 05, 2020
Applicant:

Hitachi High-tech Analytical Science Gmbh, Uedem, DE;

Inventors:

Marzena Beata Rak, Duisburg, DE;

Rainer Simons, Kranenburg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01J 3/18 (2006.01); G01J 3/02 (2006.01);
U.S. Cl.
CPC ...
G01J 3/28 (2013.01); G01J 3/021 (2013.01); G01J 3/18 (2013.01);
Abstract

The invention relates to an optical system, to a spectrometer device comprising such optical system and to a method to operate such an optical system comprising an entrance aperture for entering primary light containing both a first, lower wavelength range and a second, higher wavelength range into said optical system, a grating for spectral dispersion of the primary light beam into a first fan of diffracted light within the first wavelength range and a primary zero order light beam, a mirror element suitably positioned to reflect the primary zero order light beam back as secondary light beam to the grating where it is dispersed into a second fan of diffracted light within the second wavelength range, a detector arrangement with detectors, an absorber element to be reversibly placed within the primary zero order light beam, and a filter element to be reversibly placed within the primary light beam.


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