The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 2021
Filed:
Nov. 25, 2019
Accuray, Inc., Sunnyvale, CA (US);
Zhicong Yu, Highland Hts., OH (US);
Chuanyong Bai, Solon, OH (US);
Amit Jain, Solon, OH (US);
Daniel Gagnon, Twinsburg, OH (US);
Accuray, Inc., Sunnyvale, CA (US);
Abstract
An x-ray imaging apparatus and associated methods are provided to receive measured projection data in a primary region and measured scatter data in a shadow region and determine an estimated scatter in the primary region during a current rotation based on the measured scatter data in the shadow region from a neighboring rotation. Coverage of the shadow region during the neighboring rotation overlaps the primary region during the current rotation. A beamformer is configured to adjust a shape of the radiation beam to create the primary and shadow regions on the detector, including an embodiment to follow the Tam-Danielson window during a helical scan.