The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 2021

Filed:

Jun. 26, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Nicol Hofmann, Boeblingen, DE;

Michael Klein, Boeblingen, DE;

Kerstin Claudia Schelm, Boeblingen, DE;

Razvan Peter Figuli, Boeblingen, DE;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); H03M 13/03 (2006.01); G06F 7/72 (2006.01); H03M 13/09 (2006.01); H03M 13/07 (2006.01); G06F 5/01 (2006.01); G06F 7/499 (2006.01); G06F 11/22 (2006.01); G06F 7/483 (2006.01); G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
H03M 13/6586 (2013.01); G06F 7/724 (2013.01); H03M 13/033 (2013.01); H03M 13/07 (2013.01); H03M 13/096 (2013.01); G06F 5/012 (2013.01); G06F 7/483 (2013.01); G06F 7/49936 (2013.01); G06F 7/72 (2013.01); G06F 11/104 (2013.01); G06F 11/2226 (2013.01); G06F 2207/3824 (2013.01);
Abstract

A method includes generating an extended result from a first operation circuitry having a result register bit width greater than a bus width associated with a residue check path of a second operation circuitry associated with a floating point unit. An extended result residue less a first portion residue of the extended result received from the residue check path is stored as a first partial result residue. The first partial result residue is compared with a first result residue of the second operation circuitry. The extended result residue less both the first partial result residue and a second portion residue of the extended result received from the residue check path as a second partial result residue is compared with a second result residue of the second operation circuitry.


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