The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 2021

Filed:

Sep. 03, 2019
Applicant:

Shanghai Simgui Technology Co., Ltd., Shanghai, CN;

Inventors:

Chen Li, Shanghai, CN;

Fawang Yan, Shanghai, CN;

Feng Zhang, Shanghai, CN;

Beiji Zhao, Shanghai, CN;

Chunxue Liu, Shanghai, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/06 (2006.01); H01L 21/3065 (2006.01); H01L 29/20 (2006.01); H01L 29/66 (2006.01); H01L 29/778 (2006.01);
U.S. Cl.
CPC ...
H01L 29/0611 (2013.01); H01L 21/3065 (2013.01); H01L 29/2003 (2013.01); H01L 29/66431 (2013.01); H01L 29/778 (2013.01);
Abstract

A gallium nitride high electron mobility transistor and a formation method therefor are provided. The transistor includes: a substrate; a gallium nitride channel layer disposed on the substrate; a first barrier layer disposed on the gallium nitride channel layer; a gate, a source and a drain disposed on the first barrier layer, the source and the drain being respectively disposed on two sides of the gate; and a second barrier layer disposed on a surface of the first barrier layer between the gate and the drain, a side wall of the second barrier layer being connected to a side wall on one side of the gate and being configured to generate two-dimensional hole gas. The high electron mobility transistor has a higher breakdown voltage.


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