The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2021
Filed:
Oct. 12, 2020
Bertec Corporation, Columbus, OH (US);
Todd Christopher Wilson, Columbus, OH (US);
Necip Berme, Worthington, OH (US);
Jan Jakub Ober, Columbus, OH (US);
Bertec Corporation, Columbus, OH (US);
Abstract
A measurement and testing system is disclosed herein. The measurement and testing system includes a first measurement device and a second measurement device and a data processing device operatively coupled to the first measurement device and the second measurement device. In one or more embodiments, the data processing device is configured to synchronize each of a first plurality of data values from the first measurement device with each of a second plurality of data values from the second measurement device by determining which first timestamps associated with the first plurality of data values correspond to second timestamps associated with the second plurality of data values. In one or more other embodiments, the data processing device is configured to compute time-delayed values of one or more first measurement signals from a first measurement device using a predetermined time delay.