The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2021
Filed:
Jun. 03, 2019
Zebra Technologies Corporation, Lincolnshire, IL (US);
Eliezer Azi Ben-Lavi, Waterloo, CA;
Richard Jeffrey Rzeszutek, Toronto, CA;
Paul D. Haist, Toronto, CA;
Venu Kurella, Hamilton, CA;
Zebra Technlogies Corporation, Lincolnshire, IL (US);
Abstract
A method in an imaging controller of detecting depth sensor artifacts includes: obtaining, from first and second sensors, first and second pluralities of points defined by respective (i) planar positions and depths in a common frame of reference, and (ii) scan angles relative to field of view centers of the first or second sensors; for each of a subset of candidate points from the first plurality of points: searching the second plurality of points for a validator point having (i) a planar position within a threshold distance of a planar position of the candidate point, and (ii) a scan angle smaller than a scan angle of the candidate point; responsive to identifying the validator point: when the depth of the validator point exceeds the depth of the candidate point, classifying the candidate point as an artifact.