The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 2021

Filed:

Jun. 24, 2016
Applicant:

Cognex Corporation, Natick, MA (US);

Inventors:

David J Michael, Wayland, MA (US);

Gang Liu, Natick, MA (US);

Ali Zadeh, Hopkinton, MA (US);

Assignee:

COGNEX CORPORATION, Natick, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/33 (2017.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06T 7/337 (2017.01); G06T 2207/10028 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30108 (2013.01);
Abstract

A system and method for three dimensional (3D) vision inspection using a 3D vision system. The system and method comprising acquiring at least one 3D image of a 3D object using the 3D vision system, using the 3D vision system; extracting a 3D visible runtime mask of the 3D image; using the 3D vision system, comparing the 3D runtime visible mask to a 3D reference visible mask; and, using the 3D vision system, determining if a difference of pixels exists between the 3D runtime visible mask and the 3D reference visible mask.


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