The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2021
Filed:
Jul. 24, 2019
Jinghui LI, Sierra Madre, CA (US);
Honggan Zhu, Shenzhen, CN;
Yaxing Yao, Shenzhen, CN;
Auyora (Shenzhen) Inc., Shenzhen, CN;
Abstract
Embodiments of present invention provide a method for checking integrity of a device selection process. The method includes placing multiple devices in a device tray that has multiple cells arranged in a matrix of M-rows and N-columns; separating the multiple devices into a first group and a second group; causing a machine to memorize locations of at least the first group; removing the second group from the device tray; after the removing, causing the machine to capture an image of devices remaining in the device tray and identify locations of the remaining devices based upon the image; comparing locations so identified with locations of the first group of devices memorized by the machine; and taking a corrective action when a discrepancy is found between the locations identified and locations memorized. An apparatus for performing the above method is also provided.