The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2021
Filed:
Aug. 31, 2017
Sony Group Corporation, Tokyo, JP;
Mattias Walls, Häljarp, SE;
Francesco Michielin, Stuttgart, DE;
Daniel Linåker, Lund, SE;
Bo-Erik Månsson, Bjärred, SE;
Henrik Tuszynski, Lomma, SE;
Johannes Elg, Helsingborg, SE;
Henrik Vallgren, Furulund, SE;
Fredrik Mattisson, Lund, SE;
Fredrik Olofsson, Lund, SE;
Lars Novak, Bjärred, SE;
Sony Group Corporation, Tokyo, JP;
Abstract
Methods of determining whether an environment is suitable or acceptable for performing a three-dimensional (3D) scan are provided. The methods may include performing one or more checks on captured image data of the environment, wherein performing each of the one or more checks comprises determining whether the environment satisfies a respective criterion. The method may further include determining that the environment is suitable or unsuitable for performing the 3D scan based on a result of each performed check. Determining that the environment is suitable for performing the 3D scan may include determining that the environment satisfies each of the respective criteria of the performed one or more checks. Determining that the environment is unsuitable for performing the 3D scan may include determining that the environment does not satisfy at least one criterion of the performed one or more checks. Related devices and computer program products are also provided.