The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2021
Filed:
Feb. 23, 2018
Applicant:
Pioneer Corporation, Tokyo, JP;
Inventor:
Tomoaki Iwai, Kawagoe, JP;
Assignee:
PIONEER CORPORATION, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 21/956 (2006.01); G06T 7/00 (2017.01); G01S 17/89 (2020.01); E01C 23/01 (2006.01); G01S 7/48 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00798 (2013.01); G01N 21/95607 (2013.01); G01N 21/95684 (2013.01); G01S 17/89 (2013.01); G06T 7/001 (2013.01); E01C 23/01 (2013.01); G01N 2021/95615 (2013.01); G01S 7/4802 (2013.01); G06T 2207/30256 (2013.01);
Abstract
An object of the present invention is to provide a degraded feature identification apparatus and the like that can identify a degraded feature from a large number of features. The present invention receives light emitted from a moving object and reflected by a feature, acquires reflection intensity data measured at the moving object, and identifies a degraded feature based on acquired reflection intensity data.