The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 2021

Filed:

Feb. 04, 2019
Applicant:

Toshiba Infrastructure Systems & Solutions Corporation, Kanagawa, JP;

Inventors:

Takahiko Yamazaki, Chiba, JP;

Nobuyuki Kumakura, Kanagawa, JP;

Masaki Shiratsuki, Kanagawa, JP;

Yoko Yonekawa, Tokyo, JP;

Akira Wada, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/46 (2006.01); G06K 9/44 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00791 (2013.01); G06K 9/44 (2013.01); G06K 9/46 (2013.01);
Abstract

According to an embodiment, a captured image check system includes a camera, an image data input unit, a camera view angle judge processor, a road surface state analysis judge processor, and an output unit. The camera photographs a road surface. The image data input unit inputs image data to be used for analyzing a state of the road surface. The camera view angle judge processor performs a judge process of determining whether or not an angle of view of the camera satisfies a first condition for analyzing the state of the road surface on the basis of the image data. The road surface state analysis judge processor performs a judge process of determining whether or not a second condition for analyzing the state of the road surface is satisfied on the basis of image data of the road surface. The output unit outputs results of the judge processes.


Find Patent Forward Citations

Yamazaki, Takahiko. (2021). Captured image check system and captured image check method (U.S. Patent No. 11157750). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11157750

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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