The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2021
Filed:
Dec. 26, 2019
Ping an Technology (Shenzhen) Co., Ltd., Shenzhen, CN;
Yi Zhao, Santa Clara, CA (US);
Nan Qiao, Redwood City, CA (US);
Ruei-Sung Lin, Redwood City, CA (US);
Bo Gong, Belmont, CA (US);
Mei Han, Palo Alto, CA (US);
Ping An Technology (Shenzhen) Co., Ltd., Shenzhen, CN;
Abstract
A cultivated land recognition method in a satellite image includes: segmenting a satellite image of the Earth into a plurality of standard images; and recognizing cultivated land area in each of the standard images using a cultivated land recognition model to obtain a plurality of first images. Edges of ground level entities in each of the standard images are detected using an edge detection model to obtain a plurality of second images. Each of the first images and a corresponding one of the second images is merged to obtain a plurality of third images; and cultivated land images is obtained by segmenting each of the third images using a watershed segmentation algorithm. Not only can a result of recognizing cultivated land in satellite images of the Earth be improved, but an efficiency of recognizing the cultivated land also be improved. A computing device employing the method is also disclosed.