The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2021
Filed:
Dec. 16, 2019
Applied Materials, Inc., Santa Clara, CA (US);
Vinayak Veer Vats, San Ramon, CA (US);
Sidharth Bhatia, Santa Clara, CA (US);
Garrett Ho-Yee Sin, Sunnyvale, CA (US);
Pramod Nambiar, Sunnyvale, CA (US);
Hang Yu, San Jose, CA (US);
Sanjay Kamath, Fremont, CA (US);
Deenesh Padhi, Santa Clara, CA (US);
Heng-Cheng Pai, Cupertino, CA (US);
Applied Materials, Inc., Santa Clara, CA (US);
Abstract
A process development visualization tool generates a first visualization of a parameter associated with a manufacturing process, and provides a GUI control element associated with a process variable of the manufacturing process, wherein the GUI control element has a first setting associated with a first value for the process variable. The process development tool receives a user input to adjust the GUI control element from the first setting to a second setting, determines a second value for the process variable based on the second setting, and determines a second set of values for the parameter that are associated with the second value for the process variable. The process development tool then generates a second visualization of the parameter, wherein the second visualization represents the second set of values for the parameter that are associated with the second value for the process variable.