The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 2021

Filed:

Sep. 28, 2018
Applicant:

Splunk Inc., San Francisco, CA (US);

Inventors:

Alexander Douglas James, Sammamish, WA (US);

Manu Jose, Milpitas, CA (US);

Sourav Pal, Foster City, CA (US);

Christopher Madden Pride, Oakland, CA (US);

Nicholas Robert Romito, San Francisco, CA (US);

Igor Braylovskiy, Hillsborough, CA (US);

Arun Ramani, Bellevue, WA (US);

Ankit Jain, Arlington, VA (US);

Assignee:

Splunk Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2019.01); G06F 16/2453 (2019.01); G06F 16/242 (2019.01); G06F 16/9535 (2019.01); G06F 40/205 (2020.01); G06F 9/54 (2006.01);
U.S. Cl.
CPC ...
G06F 16/24542 (2019.01); G06F 16/2425 (2019.01); G06F 16/9535 (2019.01); G06F 40/205 (2020.01); G06F 9/547 (2013.01);
Abstract

Systems and methods are disclosed for processing and executing queries in a data intake and query system. The data intake and query system receives a first query identifying a set of data to be processed and a manner of processing the set of data. The data intake and query system parses the first query and uses a dataset association records of a metadata catalog to dynamically identify one or more datasets associated with the query and generate a second query. The data intake and query system executes the second query.


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