The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 2021

Filed:

Jun. 03, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventor:

Werner Schuetz, Nufringen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/215 (2019.01); G06F 16/23 (2019.01);
U.S. Cl.
CPC ...
G06F 16/215 (2019.01); G06F 16/2379 (2019.01);
Abstract

The present disclosure relates to a method for data quality delta analysis on a dataset. The method provides a set of data quality rules for the dataset. At least one delta rule of a set of data quality rules is defined as relevant for delta analysis of at least part of the dataset, the delta rule being a delta analysis quality rule. Data changes on the dataset are tracked. In response to determining that a number of modified records of the at least part of the dataset is higher than a predefined insert modification threshold, a data quality score may be determined for said modified records using the delta rule.


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