The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11157353 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 26, 2021

Filed:

Jan. 02, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventor:

David A. Pierce, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1004 (2013.01); G06F 3/064 (2013.01); G06F 3/0619 (2013.01); G06F 3/0635 (2013.01); G06F 3/0673 (2013.01); G06F 11/1076 (2013.01); G06F 2211/104 (2013.01);
Abstract

In one embodiment, a method includes receiving data comprising a plurality of data elements; creating a binary sequence comprising a plurality of bonus bits using a first binary sequence generator; using a first exclusive-or module to provide a XOR calculation using bits of each data element of the data with a bonus bit from the binary sequence; passing each data element along with its corresponding parity bit to an input of a data path; receiving each data element along with its corresponding parity bit at an output of the data path; creating the binary sequence using a second binary sequence generator; using a second XOR module to XOR together bits of each data element along with its corresponding parity bit and a bonus bit from the binary sequence to produce a result; and analyzing the result to determine whether an error has occurred to the data in the data path.


Find Patent Forward Citations

Pierce, David. (2021). Detecting single event upsets and stuck-at faults in ram-based data path controllers (U.S. Patent No. 11157353). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11157353

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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