The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 2021

Filed:

Jul. 29, 2019
Applicant:

Facebook Technologies, Llc, Menlo Park, CA (US);

Inventors:

Bo Zhang, Redmond, WA (US);

Yijing Fu, Redmond, WA (US);

Assignee:

FACEBOOK TECHNOLOGIES, LLC, Menlo Park, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/00 (2006.01); G02B 27/01 (2006.01); G06F 3/01 (2006.01);
U.S. Cl.
CPC ...
G02B 27/0081 (2013.01); G02B 27/0093 (2013.01); G02B 27/0172 (2013.01); G06F 3/013 (2013.01); G02B 2027/0123 (2013.01);
Abstract

A near-eye display (NED) using a pupil expander to expand an eyebox of the NED may suffer from local variations of throughput and color reproduction introduced by the pupil expander of the display. To offset or compensate these variations, the pupil expander, e.g. a pupil-replicating waveguide, may be characterized at a plurality of non-uniformly spaced grid of test points, with the test points disposed more densely at areas of high spatial variation of the throughput or color shift introduced by the pupil expander. The throughput or color shift may be integrated over at least a portion of the field of view of the NED. To determine the areas of high spatial variation, an initial test may be performed at uniformly spaced test grid locations.


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