The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2021
Filed:
Feb. 26, 2018
Nanjing University of Science and Technology, Jiangsu, CN;
Qian Chen, Nanjing, CN;
Chao Zuo, Nanjing, CN;
Jiasong Sun, Nanjing, CN;
Shijie Feng, Nanjing, CN;
Yuzhen Zhang, Nanjing, CN;
Guohua Gu, Nanjing, CN;
NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY, Nanjing, CN;
Abstract
A high-illumination numerical aperture-based large field-of-view high-resolution microimaging device, and a method for iterative reconstruction, the device comprising an LED array (), a stage (), a condenser (), a microscopic objective (), a tube lens (), and a camera (), the LED array () being arranged on the forward focal plane of the condenser (). Light emitted by the i-th lit LED unit () of the LED array () passes through the condenser () and converges to become parallel light illuminating a specimen () to be examined, which is placed on the stage (); part of the diffracted light passing through the specimen () is collected by the microscopic objective (), converged by the tube lens (), and reaches the imaging plane of the camera (), forming an intensity image recorded by the camera (). The present device and method ensure controllable programming of the illumination direction, while also ensuring an illumination-numerical-aperture up to 1.20 and thus achieving a reconstruction resolution up to 0.15 μm.