The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 2021

Filed:

Aug. 01, 2019
Applicant:

David Kessler, New York, NY (US);

Inventor:

David Kessler, New York, NY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0032 (2013.01); G02B 21/006 (2013.01); G02B 21/008 (2013.01); G02B 21/0048 (2013.01);
Abstract

A scanning microscope apparatus has a laser light to generate a beam at an excitation wavelength. A beam expander enlarges the beam width and forms a collimated beam, scanned in a raster pattern. A catadioptric objective has a curved partially transmissive mirror surface symmetric about an optical axis and disposed to focus a portion of the received scanned collimated beam toward a focal plane at the sample, wherein the mirror surface has a center of curvature either at an axis of rotation of the scanner or at an image of the axis of rotation. A reflective polarizer cooperates with the curved mirror to direct the focused light toward the sample. One or more polarization retarders condition excitation light conveyed toward and away from the curved mirror. A beam splitter separates the generated laser light from a signal and directs the signal toward a detector.


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