The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 2021

Filed:

Dec. 23, 2019
Applicant:

Nuctech Company Limited, Beijing, CN;

Inventors:

Ziran Zhao, Beijing, CN;

Yingkang Jin, Beijing, CN;

Lingbo Qiao, Beijing, CN;

Zhimin Zheng, Beijing, CN;

Ming Xu, Beijing, CN;

Xilei Luo, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/3586 (2014.01); G01V 8/00 (2006.01); G03H 1/00 (2006.01);
U.S. Cl.
CPC ...
G01V 8/005 (2013.01); G03H 1/00 (2013.01);
Abstract

The disclosure discloses a millimeter wave security inspection apparatus and a method for inspecting human or article. The apparatus includes: a door device including a first door and a second door arranged in a stacked mode and each made of a material allowing a millimeter wave to penetrate therethrough; a millimeter wave transceiver arranged between the first door and the second door and including an millimeter wave transceiving antenna array configured to transmit and receive a millimeter wave signal to and from an entrance side and an exit side of the door device; and a linear driver to which the millimeter wave transceiver is connected to be movable relative to the door device, so as to scan a first side of an object positioned at the entrance side and a second side of the object opposite to the first side positioned at the exit side.


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