The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2021
Filed:
Mar. 27, 2018
Koninklijke Philips N.v., Eindhoven, NL;
Roland Proksa, Neu Wulmstorf, DE;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
The present invention relates to a detector arrangement for an X-ray phase contrast system (), the detector arrangement () comprising: a scintillator (); an optical grating (); and a detector (); wherein the optical grating () is arranged between the scintillator () and the detector (); wherein the scintillator () converts X-ray radiation () into optical radiation (); wherein the optical grating () is configured to be an analyzer grating being adapted to a phase-grating () of an X-ray phase contrast system (); wherein the optical path between the optical grating () and the scintillator () is free of focusing elements for optical radiation. The present invention further relates to a method () for performing X-ray phase contrast imaging with a detector arrangement () mentioned above. The invention avoids the use of an X-ray absorption grating as G2 grating in an X-ray phase contrast interferometer system.