The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2021
Filed:
Jun. 06, 2018
President and Fellows of Harvard College, Cambridge, MA (US);
Connor A. Hart, Cambridge, MA (US);
Erik Bauch, Cambridge, MA (US);
Ronald L. Walsworth, Newton, MA (US);
Matthew James Turner, Somerville, MA (US);
Jennifer May Schloss, Cambridge, MA (US);
John Francis Barry, Cambridge, MA (US);
President and Fellows of Harvard College, Cambridge, MA (US);
Abstract
A method and system of measuring a direct current magnetic field using a plurality of spin centers are disclosed. A spin bath associated with the spin centers may be driven with a first source of electromagnetic radiation to reduce dephasing of the spin centers. The spin centers may be measured using double quantum (DQ) magnetometry in order to reduce the effects of crystal strain on spin dephasing times. An electromagnetic response of at least one of the plurality of spin centers may be observed using an electromagnetic radiation collection device. Accordingly, up to an eight times improvement in DC field sensitivity may be accomplished for a spin center ensemble.