The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 2021

Filed:

Jun. 20, 2019
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Ryohei Matsui, Tokyo, JP;

Nobuyuki Sugii, Tokyo, JP;

Tetsufumi Kawamura, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/01 (2020.01); G01N 19/08 (2006.01); G01R 31/28 (2006.01); G01H 1/04 (2006.01); G01H 1/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/016 (2013.01); G01H 1/003 (2013.01); G01H 1/04 (2013.01); G01N 19/08 (2013.01); G01R 31/2881 (2013.01);
Abstract

One preferable aspect of the present invention is a state detecting system which detects a state of a machine device based on a detection signal from a detecting element provided to the machine device, and is the state detecting system which includes a non-normal time rate detecting unit which detects a rate or a value as a non-normal time rate, the rate being a rate of an integration value of a time during which an amplitude of the detection signal exceeds a predetermined normal amplitude within a predetermined time, and the value being physically equivalent to the rate.


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