The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2021
Filed:
Jan. 03, 2019
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Martin Cochet, White Plains, NY (US);
Troy James Beukema, Briarcliff Manor, NY (US);
Assignee:
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/20 (2006.01); G01R 19/10 (2006.01); G01R 19/00 (2006.01); G01R 15/16 (2006.01); G01R 21/06 (2006.01); G01R 35/00 (2006.01);
U.S. Cl.
CPC ...
G01R 19/10 (2013.01); G01R 1/203 (2013.01); G01R 15/16 (2013.01); G01R 19/0084 (2013.01); G01R 19/0092 (2013.01); G01R 21/06 (2013.01); G01R 35/005 (2013.01); H01L 2924/00 (2013.01); H01L 2924/0002 (2013.01);
Abstract
Devices, systems, and methods that can facilitate in situ probing of a discrete time circuit components are provided. According to an embodiment, a device can comprise a hold circuit that can generate a sampled signal at a holding stage. The device can further comprise an in situ probe device that can be coupled to the hold circuit that can measure one or more operating voltage values at the holding stage based on the sampled signal.