The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 2021

Filed:

Jan. 23, 2018
Applicant:

Hitachi High-technologies Corporation, Tokyo, JP;

Inventors:

Takamichi Mori, Tokyo, JP;

Tetsuji Kawahara, Tokyo, JP;

Yuichi Iwase, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/10 (2006.01);
U.S. Cl.
CPC ...
G01N 35/1002 (2013.01); G01N 35/1004 (2013.01); G01N 35/1011 (2013.01);
Abstract

An automatic analyzer includes a cleaning mechanism performing cleaning to drying of a probe in a short time even with a wide cleaning range of the probe. The automatic analyzer includes: a cleaning tank into which a probe is insertable and which has a cleaning port provided with suction openings; a vacuum tank; a vacuum pump that causes the vacuum tank to enter a negative pressure state, compared to atmospheric pressure; a vacuum bin; a suction nozzle that connects the suction opening of the cleaning port and the vacuum bin; a vacuum nozzle that connects the vacuum tank and the vacuum bin; and a controller. The controller causes the vacuum tank which is in the negative pressure state and the cleaning port to be conducted via the vacuum bin in a period during which a cleaning solution, with which the probe is cleaned, is discharged through the cleaning port.


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