The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2021
Filed:
Jun. 22, 2018
Fujifilm Corporation, Tokyo, JP;
Yasuhiko Kaneko, Tokyo, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
There are provided a defect inspection apparatus, method, and program for, in a case of using an image of an inspection-target industrial product (test object) to conduct an inspection to check whether defects are present, allowing an image interpreter to precisely and efficiently detect defects. A possible-defect image Dindicating a crack-like defect and a simulation result image Pindicating the predicted growth of the crack-like defect are displayed. Sliders Land Land checkboxes CBare used to enable selection of possible defects and simulation results to be displayed. An image interpreter can use the checkboxes CBto select a type of possible defect to be displayed, and can use the sliders Land Lto select possible defects to be displayed on the basis of the wall thickness of portions in which possible defects are detected and the size of possible defects.