The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 2021

Filed:

May. 17, 2019
Applicant:

The Wave Talk, Inc., Daejeon, KR;

Inventors:

Young Dug Kim, Gyeonggi-do, KR;

Seung Bum Yang, Daejeon, KR;

Kyoung Man Cho, Seoul, KR;

Dong Jun Jeong, Daejeon, KR;

Nam Kyun Kim, Gyeonggi-do, KR;

Assignee:

THE WAVE TALK, INC., Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/06 (2006.01); G01N 33/18 (2006.01); B01D 47/00 (2006.01); G02B 27/48 (2006.01); B01D 47/02 (2006.01);
U.S. Cl.
CPC ...
G01N 15/06 (2013.01); B01D 47/00 (2013.01); G01N 33/1826 (2013.01); G02B 27/48 (2013.01); B01D 47/02 (2013.01); B01D 2252/103 (2013.01); G01N 2015/0693 (2013.01);
Abstract

According to an embodiment of the present disclosure, provided is an optical detection system for detecting a laser speckle generated by multiple scattering of a wave irradiated toward a sample from a wave source, and based on a change in the laser speckle over time, detecting the presence of microbes in the sample in real time.


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