The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 2021

Filed:

Oct. 24, 2019
Applicant:

Sumitomo Electric Industries, Ltd., Osaka, JP;

Inventors:

Takemi Hasegawa, Osaka, JP;

Tetsuya Hayashi, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 11/00 (2006.01); G02B 6/02 (2006.01); G01M 11/08 (2006.01);
U.S. Cl.
CPC ...
G01M 11/31 (2013.01); G01M 11/3109 (2013.01); G02B 6/02042 (2013.01); G01M 11/088 (2013.01); G01M 11/3172 (2013.01); G01M 11/39 (2013.01); G02B 6/02009 (2013.01);
Abstract

The present invention relates to a method and device for measuring optical nonlinearity of an optical fiber to be measured comprising a plurality of cores having mutually coupled waveguide modes. The method includes, at least, preparing a laser light source emitting laser light and a detecting unit determining an optical intensity, inputting laser light into a specific core of the optical fiber to be measured, determining the intensity of a specific wavelength component caused by optical nonlinearity among the reflective light components from the optical fiber to be measured, and determining optical nonlinearity of the optical fiber to be measured on the basis of the intensity of the specific wavelength component.


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