The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2021
Filed:
Dec. 19, 2016
Ihi Corporation, Koto-ku, JP;
Hatsuo Mori, Koto-ku, JP;
Keisuke Suzuki, Koto-ku, JP;
Noriyoshi Mizukoshi, Koto-ku, JP;
Takashi Ogai, Koto-ku, JP;
IHI Corporation, Koto-ku, JP;
Abstract
An abnormality determination device according to one aspect of the present disclosure is an abnormality determination device that determines an abnormality of an inducer used for a pump, the abnormality determination device including a stress-response acquisition unit that acquires a stress response indicating a temporal change in stress applied to the inducer, an accumulated-fatigue-damage-degree calculation unit that calculates an accumulated fatigue-damage degree of the inducer based on the stress response, a lifetime-consumption-rate calculation unit that calculates a lifetime consumption rate that is a changing rate of the accumulated fatigue-damage degree with respect to time, and a determination unit that determines an abnormality of the inducer based on the accumulated fatigue-damage degree and the lifetime consumption rate, in which the inducer is used only for a predetermined use time per operation of the pump.