The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2021
Filed:
Feb. 05, 2018
Nec Corporation, Tokyo, JP;
Tetsuri Ariyama, Tokyo, JP;
Tan Azuma, Tokyo, JP;
Soichiro Araki, Tokyo, JP;
Kenichiro Fujiyama, Tokyo, JP;
Mineto Satoh, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
Provided are an abnormality determination device and the like that are able to accurately determine abnormalities regarding an inspection subject. The abnormality determination device is configured to calculate a scatter degree of differences between prediction information on an observation target and observation information on the observation target, the prediction information being an information generated in accordance with a scenario that represents an aspect of state change of the observation target, the observation information generated by an inspection target; and determine whether or not the inspection target is abnormal based on the calculated degree.