The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2021
Filed:
Nov. 30, 2016
Applicant:
Keysight Technologies, Inc., Santa Rosa, CA (US);
Inventor:
Greg C. Felix, San Jose, CA (US);
Assignee:
Keysight Technologies, Inc., Santa Rosa, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02058 (2013.01); G01B 9/02 (2013.01); G01B 9/02007 (2013.01); G01B 9/02028 (2013.01); G01B 2290/30 (2013.01); G01B 2290/70 (2013.01);
Abstract
An interferometer has a first input configured to provide a first measurement beam at a first frequency, and a second measurement signal at the first frequency. The interferometer has a second input configured to provide a reference beam at a second frequency that is different than the first frequency; an optical element comprising a first portion comprising a polarization beam splitter; and a diffraction grating disposed over the optical element configured to diffract the first measurement beam and the second measurement beam.