The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2021
Filed:
Dec. 07, 2016
Applicant:
Hamamatsu Photonics K.k., Hamamatsu, JP;
Inventors:
Toyohiko Yamauchi, Hamamatsu, JP;
Hidenao Yamada, Hamamatsu, JP;
Assignee:
HAMAMATSU PHOTONICS K.K., Hamamatsu, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01N 21/45 (2006.01); G02B 21/14 (2006.01); G02B 21/18 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02041 (2013.01); G01N 21/45 (2013.01); G02B 21/14 (2013.01); G02B 21/18 (2013.01);
Abstract
An interference observation apparatus includes a light source, a splitting beam splitter, a combining beam splitter, a mirror, a beam splitter, a mirror, a piezo element, a stage, a photodetector, an image acquisition unit, and a current control unit. An interference optical system from the splitting beam splitter to the combining beam splitter forms a Mach-Zehnder interferometer. The current control unit controls a wavelength of laser light output from the light source to adjust a phase difference between two split light components at the combining by the combining beam splitter.