The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2021

Filed:

Feb. 28, 2020
Applicant:

X Development Llc, Mountain View, CA (US);

Inventors:

Emily Cooper, Mountain View, CA (US);

Chad Talbott, Mountain View, CA (US);

Assignee:

X Development LLC, Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/235 (2006.01); H04N 5/243 (2006.01);
U.S. Cl.
CPC ...
H04N 5/2352 (2013.01); H04N 5/2351 (2013.01); H04N 5/2356 (2013.01); H04N 5/2353 (2013.01); H04N 5/243 (2013.01); Y10S 901/47 (2013.01);
Abstract

An example method includes determining, by a controller of an image capture system, a plurality of sets of exposure parameter values for one or more exposure parameters. The plurality of sets of exposure parameter values are determined at an exposure determination rate. The method further includes capturing, by an image capture device of the image capture system, a plurality of images. Each image of the plurality of images is captured according to a set of exposure parameter values of the plurality of sets of exposure parameter values. The method also includes sending, by the controller of the image capture system to an image processing unit, a subset of the plurality of images. Each subset of images is sent at a sampling rate, and the sampling rate is less than the exposure determination rate.


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