The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2021

Filed:

Oct. 16, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Dattaram Bijavara Aswathanarayana Rao, Bangalore, IN;

Saurabh Gupta, Houston, TX (US);

Rakesh Sharma Mangala Nagendra Rao, Bangalore, IN;

Vishwanath Narayan, Boca Raton, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 7/00 (2006.01); G06N 5/04 (2006.01); G06N 20/00 (2019.01); H04L 12/24 (2006.01); H04L 29/08 (2006.01); H04W 4/70 (2018.01); H04W 4/50 (2018.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 41/142 (2013.01); G06N 5/047 (2013.01); G06N 7/005 (2013.01); G06N 20/00 (2019.01); H04L 41/16 (2013.01); H04L 67/322 (2013.01); H04W 4/50 (2018.02); H04W 4/70 (2018.02); H04L 41/08 (2013.01); H04L 41/147 (2013.01); H04L 43/0852 (2013.01); H04L 67/10 (2013.01);
Abstract

A method, computer program product, and computer system are disclosed. The method includes determining probability of high data flow event, memory requirements for the high data flow and time to high data flow event by using pattern recognition based on natural language Processing (NLP), machine learning and statistical algorithms. The method applies a configuration to the edge device and network system when the probability of high data flow event is above a predetermined threshold for handling the high data flow event.


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