The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2021

Filed:

Aug. 31, 2018
Applicant:

Muehlbauer Gmbh & Co. KG, Roding, DE;

Inventors:

Franz Uwe Augst, Wackersdorf, DE;

Benjamin Holzner, Oberviechtach, DE;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/68 (2006.01); B65G 47/86 (2006.01); H05K 13/08 (2006.01); B23P 19/00 (2006.01);
U.S. Cl.
CPC ...
H01L 21/681 (2013.01); B23P 19/00 (2013.01); B65G 47/847 (2013.01); H05K 13/081 (2018.08); H05K 13/0815 (2018.08);
Abstract

A device for aligning and optically inspecting a semiconductor component arranged on a receiving tool that is arranged on a turning mechanism. The device aligns the semiconductor component in relation to a center of the receiving tool in at least one axis direction and/or a direction of rotation. The turning mechanism is designed to rotate about a turning axis and to move the semiconductor component out of a receiving position into an offset position, with two slides that can be moved towards and away from each other and comprise slide sections, the two slide sections coming to rest on two lateral surfaces of the semiconductor component, at least in sections, in order to align the semiconductor component arranged on the receiving tool, the slide being defined such that it slides and/or rotates the semiconductor component into an inspection position, while the receiving tool holds the semiconductor component.


Find Patent Forward Citations

Augst, Franz. (2021). Device for aligning and optically inspecting a semiconductor component (U.S. Patent No. 11152243). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11152243

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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