The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2021
Filed:
Jun. 22, 2016
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
Kenji Mashio, Tokyo, JP;
Takae Yamashita, Tokyo, JP;
Takashi Azuma, Tokyo, JP;
Susumu Shiizuka, Tokyo, JP;
Junichi Nishitani, Tokyo, JP;
Masafumi Utsumi, Tokyo, JP;
Jun Shibuya, Tokyo, JP;
MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;
Abstract
This abnormality diagnosis system for diagnosing abnormalities in a plant is provided with: an abnormality diagnosis control unit which, with respect to an instrument parameter measured in a plant determined to have an indication of abnormality, predicts the development of the instrument parameter by extrapolation, and which generates an abnormality manifestation pattern that is a pattern of behavior of the instrument parameter after prediction; and a data storage unit which stores a plurality of abnormality model patterns PA, PB that are patterns of behavior of the instrument parameters corresponding to causes CA, CA, CB, CBof plant abnormality. The abnormality diagnosis control unit makes a matching determination between the abnormality manifestation pattern that has been generated and the plurality of abnormality model patterns PA, PB stored in the data storage unit, and identifies, as the cause of the abnormality in the abnormality manifestation pattern.