The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2021

Filed:

Sep. 11, 2018
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Haiyan Wang, Fremont, CA (US);

Hsiu-Khuern Tang, San Jose, CA (US);

Abhay Mehta, Austin, TX (US);

Laleh Jalali, San Jose, CA (US);

Maojing Fu, Sunnyvale, CA (US);

Hiroaki Ozaki, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16H 50/20 (2018.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G16H 50/20 (2018.01); G06N 20/00 (2019.01);
Abstract

In some examples, a system may generate a plurality of care path patient profile models based on a plurality of care path patterns for a plurality of past patient admissions. For example, each care path patient profile model may include a trained classifier. Further, the system may receive information related to a new patient admission, and may generate features from the received information related to the new patient admission. The system may input the features generated from the received information related to the new patient admission into the plurality of care path patient profile models to obtain a respective probability of being classified in a respective care path based on an amount of similarity to the patients who have gone through each care path. In addition, the system may present, on a display, information related to at least one care path pattern in a graphical user interface.


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