The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2021

Filed:

Nov. 13, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Nikolaos Papandreou, Thalwil, CH;

Roman A. Pletka, Uster, CH;

Sasa Tomic, Kilchberg, CH;

Nikolas Ioannou, Zurich, CH;

Charalampos Pozidis, Thalwil, CH;

Aaron D. Fry, Richmond, TX (US);

Timothy Fisher, Cypress, TX (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/12 (2006.01); G11C 11/56 (2006.01); G06F 3/06 (2006.01); G11C 16/04 (2006.01); G11C 16/26 (2006.01);
U.S. Cl.
CPC ...
G11C 11/5642 (2013.01); G06F 3/0604 (2013.01); G06F 3/0632 (2013.01); G06F 3/0659 (2013.01); G06F 3/0679 (2013.01); G11C 11/5671 (2013.01); G11C 16/0483 (2013.01); G11C 16/26 (2013.01);
Abstract

Performing a calibration of a NAND flash memory block that is in an open state. An open state of the NAND flash memory block is detected, the NAND flash memory block comprising a plurality of memory pages, each of which comprising a plurality of memory cells. A group of pages of the NAND flash memory block being in an open state having comparable characteristics is identified. A calibration of read voltage values to pages of the group of identified pages is performed.


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