The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2021
Filed:
Aug. 30, 2019
Beijing Boe Optoelectronics Technology Co., Ltd., Beijing, CN;
Boe Technology Group Co., Ltd., Beijing, CN;
Xiaolei Liu, Beijing, CN;
Lili Chen, Beijing, CN;
Yunqi Wang, Beijing, CN;
Minglei Chu, Beijing, CN;
BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD., Beijing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
Abstract
A method for detecting image defects is described, which includes obtaining an image to be detected, down-sampling the image to be detected to obtain a down-sampled image, de-cluttering the down-sampled image to obtain a de-cluttered image, restoring the de-cluttered image into a restored image having the same resolution as the image to be detected so as to be used as a background image, and comparing the image to be detected with the background image to determine defects in the image to be detected. An apparatus for detecting image defects, a computing device and a storage medium are also described.