The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2021
Filed:
Jan. 29, 2020
Konica Minolta, Inc., Tokyo, JP;
Makoto Ikeda, Hachioji, JP;
KONICA MINOLTA, INC., Tokyo, JP;
Abstract
An image inspecting apparatus includes a reader that reads an image on a recording material formed in an image forming apparatus and generates read image data and an image analyzer that performs analysis to determine abnormality for the read image data by using a threshold value and creates an analysis result. The image analyzer makes pixels constituting the read image data a target pixel sequentially and performs determination of abnormality for the target pixel by using the threshold value calculated by using a threshold value calculating method. The threshold value calculating method includes a plurality of threshold value calculating methods, and a first threshold value calculating method is switched to other threshold value calculating method correspondingly to a number of pixels included in a region for calculating a threshold value.