The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2021

Filed:

Oct. 20, 2020
Applicant:

Entrupy Inc., New York, NY (US);

Inventors:

Ashlesh Sharma, Redmond, WA (US);

Ryan Keavney, New York, NY (US);

Drew Barclay, New York, NY (US);

Karl Friesen, New York, NY (US);

Dharini Raghavan, Jersey City, NJ (US);

Vishal Kanchan, New York, NY (US);

Leah Grossart, Brooklyn, NY (US);

Tiago Carvalho, Campinas, BR;

Assignee:

Entrupy Inc., New York, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/63 (2006.01); G06Q 30/00 (2012.01); G06K 19/06 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06Q 30/0185 (2013.01); G06K 19/06009 (2013.01); G06T 7/001 (2013.01); G06T 2207/30124 (2013.01);
Abstract

A method and system may be used to determine whether a suspect item is counterfeit. In the method and system, images may be analyzed in order to identify regions of interest of the item. The method and system may compare characteristics of different regions of interests against threshold characteristics derived from an item model. A determination that the suspect item is counterfeit is based on a result of the comparison.


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