The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2021
Filed:
Dec. 22, 2017
International Business Machines Corporation, Armonk, NY (US);
Amram Abutbul, Haifa, IL;
Yu Cao, Santa Clara, CA (US);
Simona Cohen, Haifa, IL;
Ahmed El Harouni, San Jose, CA (US);
Deepika Kakrania, San Jose, CA (US);
Tanveer F. Syeda-Mahmood, Cupertino, CA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Mechanisms are provided to implement a multi-layer analytics framework. The multi-layer analytics framework obtains a plurality of analytics from one or more analytics source computing systems, at least two analytics being written in different computer programming languages. The multi-layer analytics framework applies a wrapper to each of the analytics in the plurality of analytics to thereby generate wrapped analytics. The wrapper provides a unified interface for executing the analytics in the plurality of analytics regardless of the particular computer programming language used to create the analytics. The multi-layer analytics framework registers the wrapped analytics in an analytics registry, and executes an analytics pipeline comprising wrapped analytics in the analytics registry to perform an analytics operation based on the unified interface of the wrappers of the wrapped analytics.