The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2021

Filed:

May. 26, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Rhonda L. Childress, Austin, TX (US);

Justin D. Eyster, Selinsgrove, PA (US);

Avery K. Rowe, Venice, CA (US);

Priyanka Sarkar, Austin, TX (US);

Christopher E. Whitridge, Gaithersburg, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2006.01); G06K 9/62 (2006.01); G06K 9/00 (2006.01); G06K 9/46 (2006.01); G06N 3/04 (2006.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06K 9/00624 (2013.01); G06K 9/4628 (2013.01); G06K 9/6232 (2013.01); G06K 9/6271 (2013.01); G06N 3/0454 (2013.01);
Abstract

A method, computer system, and a computer program product for generating a location tag for a piece of visual data using deep learning is provided. The present invention may include receiving the piece of visual data. The present invention may also include analyzing the received piece of visual data using a neural network. The present invention may then include retrieving a location for the analyzed piece of visual data from the neural network. The present invention may further include generating a plurality of metadata for the retrieved location associated with the analyzed piece of visual data, wherein the generated plurality of metadata includes the location tag.


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